Sponsored by
Technical Sponsors
- The Japan Society for Precision Engineering Technical Committee on 3D Scanning, Recognition, and Modeling of Large Scale Environments (JSPE)
- Pattern Recognition Driven to a Non-Development Environment Site for Application Cooperative Committee (IEEJ)
- Computer Aided Image Surveillance And Recognition (IEEJ)
- Pattern Measurement Group (SICE)
- Manufacturing Process Inspection Department (JSNDI)
In Cooperation with
- The Institute of Electrical Engineers of Japan (IEEJ)
- The Society of Instrument and Control Engineers (SICE)
- The Japanese Society for Non-Destructive Inspection (JSNDI)
- Information Processing Society of Japan (IPSJ)
- The Robotics Society of japan (RSJ)
- The Institute of Electronics, Information and Communication Engineerings (IEICE)
- The Japan Institute of Electronics Packaging (JIEP)
- The Society of Sensing Technology of Japan (SSTJ)
- Nippon Electric Control Equipment Industries Association (NECA)
- Symposium on Sensing via Image Information (SSII)
